These
images demonstrate the effects of temperature on charge
transfer efficiency (CTE). They show the dark current
exposure of a radiation damaged CCD (SITe 2K x 4K), at
-90o and -110Co. The colder temperature causes the"freezing
out" of some charge traps, resulting in better CTE.
This
image shows the 55 Fe exposure of a radiation damaged
CCD (SITe 2K x 4K). The left side shows pronounced effects
from radiation damage. This damage is evident by the telltale
charge trails of x-ray photons.
These
charts illustrate the differences in K-alpha and K-beta
55 Fe lines for the less damaged and more damaged sides
of the CCD.
Air
Force Target imaged with Hawaii multiplexer in visible
range. Image was projected with Offner relay optical system.
Visible in background pattern is caused by scratches on
the multiplexer surface. Image de-interlacing has been
done by postprocessing.
